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1

Tweeting situational awareness during the Sydney siege

Archie, Benjamin

Journal:

Journal of Policing Intelligence and Counter Terrorism

Year:

2016

Language:

english

File:

PDF, 1.25 MB

english, 2016

2

The role of water, sanitation and hygiene interventions in reducing soil-transmitted helminths: interpreting the evidence and identifying next steps

Vaz Nery, Susana, Pickering, Amy J., Abate, Ebba, Asmare, Abraham, Barrett, Laura, Benjamin-Chung, Jade, Bundy, Donald A. P., Clasen, Thomas, Clements, Archie C. A., Colford, John M., Ercumen, Ayse, C

Journal:

Parasites & Vectors

Year:

2019

Language:

english

File:

PDF, 825 KB

english, 2019

3

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Fundamental limits of optical critical dimension metrology: a simulation study

Silver, Richard, Archie, Chas N., Germer, Thomas, Attota, Ravikiran, Barnes, Bryan M., Bunday, Benjamin, Allgair, John, Marx, Egon, Jun, Jay

Year:

2007

Language:

english

File:

PDF, 624 KB

english, 2007

4

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2008)] Metrology, Inspection, and Process Control for Microlithography XXII - Impact of sampling on uncertainty: semiconductor dimensional metrology applications

Bunday, Benjamin, Allgair, John A., Raymond, Christopher J., Rijpers, Bart, Banke, Bill, Archie, Chas, Peterson, Ingrid B., Ukraintsev, Vladimir, Hingst, Thomas, Asano, Masafumi

Year:

2008

Language:

english

File:

PDF, 910 KB

english, 2008

5

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - Scatterometry measurements of line end shortening structures for focus-exposure monitoring

Hung, Kelvin, Archie, Chas N., Cheng, Yung Feng, Sun, Jie Wei, Lin, Benjamin Szu-Min, Fu, Steven, Dziura, Thaddeus G., Cusacovich, Marcelo, Mieher, Walter D.

Year:

2006

Language:

english

File:

PDF, 736 KB

english, 2006

6

The ommaya reservoir. Newly recognized complications and recommendations for insertion and use

W. Archie Bleyer, Philip A. Pizzo, Alexander M. Spence, William D. Platt, Denis R. Benjamin, Jerry Kolins, David G. Poplack

Journal:

Year:

1978

Language:

english

File:

PDF, 2.09 MB

english, 1978

7

A dominant negative Cx43 mutant differentially affects tumorigenic and invasive properties in human metastatic melanoma cells

Zucker, Shoshanna N., Bancroft, Tara A., Place, David E., Des Soye, Benjamin, Bagati, Archis, Berezney, Ronald

Journal:

Journal of Cellular Physiology

Year:

2013

Language:

english

File:

PDF, 293 KB

english, 2013

8

Preferential induction of apoptotic cell death in melanoma cells as compared with normal keratinocytes using a non-thermal plasma torch

Zucker, Shoshanna N., Zirnheld, Jennifer, Bagati, Archis, DiSanto, Thomas M., Des Soye, Benjamin, Wawrzyniak, Joseph A., Etemadi, Kasra, Nikiforov, Mikhail, Berezney, Ronald

Journal:

Cancer Biology & Therapy

Year:

2012

Language:

english

File:

PDF, 1.31 MB

english, 2012

9

Value-Added Metrology

Bunday, Benjamin D., Allgair, John A., Caldwell, Mark, Solecky, Eric P., Archie, Charles N., Rice, Bryan J., Singh, Bhanwar, Cain, Jason P., Emami, Iraj

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2007

Language:

english

File:

PDF, 1.75 MB

english, 2007

10

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - High-performance imprint lithography and novel metrology methods using multifunctional perfluoropolyethers

Rothrock, Ginger Denison, Maynor, Benjamin, Rolland, Jason P., DeSimone, Joseph M., Archie, Chas N.

Year:

2006

Language:

english

File:

PDF, 2.40 MB

english, 2006

11

Validation of a Remote Sensing Model to Identify Simulium damnosum s.l. Breeding Sites in Sub-Saharan Africa

Jacob, Benjamin G., Novak, Robert J., Toe, Laurent D., Sanfo, Moussa, Griffith, Daniel A., Lakwo, Thomson L., Habomugisha, Peace, Katabarwa, Moses N., Unnasch, Thomas R., Clements, Archie C. A.

Journal:

PLoS Neglected Tropical Diseases

Year:

2013

Language:

english

File:

PDF, 955 KB

english, 2013

12

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - Small feature accuracy challenge for CD-SEM metrology physical model solution

Bunday, Benjamin, Allgair, John, Adan, Ofer, Tam, Aviram, Latinski, Sergey, Eytan, Guy, Archie, Chas N.

Year:

2006

Language:

english

File:

PDF, 1.48 MB

english, 2006

13

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - TEM calibration methods for critical dimension standards

Orji, Ndubuisi G., Dixson, Ronald G., Garcia-Gutierrez, Domingo I., Bunday, Benjamin D., Bishop, Michael, Cresswell, Michael W., Allen, Richard A., Allgair, John A., Archie, Chas N.

Year:

2007

Language:

english

File:

PDF, 677 KB

english, 2007

14

Congenital Agastria

Dorney, Stuart F. A., Middleton, Archie W., Kozlowski, Kazimierz, Benjamin, Bruce N. P., Kan, Alex E., Kamath, K. Ramanand

Journal:

Journal of Pediatric Gastroenterology & Nutrition

Year:

1987

File:

PDF, 513 KB

1987

15

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - 65-nm photolithography process window qualification study with advanced e-beam metrology and inspection systems

Hsu, Ruei Hung, Archie, Chas N., Lin, Benjamin Szu-Min, Wu, Wei-Yih, Xiao, Hong, Jau, Jack

Year:

2006

Language:

english

File:

PDF, 511 KB

english, 2006

16

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Meeting overlay requirements for future technology nodes with in-die overlay metrology

Schulz, Bernd, Archie, Chas N., Seltmann, Rolf, Busch, Jens, Hempel, Fritjof, Cotte, Eric, Alles, Benjamin

Year:

2007

Language:

english

File:

PDF, 402 KB

english, 2007

17

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - SEM metrology for advanced lithographies

Bunday, Benjamin, Archie, Chas N., Allgair, John, Rice, Bryan J., Byers, Jeff, Avitan, Yohanan, Peltinov, Ram, Bar-zvi, Maayan, Adan, Ofer, Swyers, John, Shneck, Roni Z.

Year:

2007

Language:

english

File:

PDF, 590 KB

english, 2007

18

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Realizing "value-added" metrology

Bunday, Benjamin, Archie, Chas N., Lipscomb, Pete, Allgair, John, Patel, Dilip, Caldwell, Mark, Solecky, Eric, Archie, Chas, Morningstar, Jennifer, Rice, Bryan J., Singh, Bhanwar, Cain, Jason, Emami,

Year:

2007

Language:

english

File:

PDF, 741 KB

english, 2007

19

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - Litho-metrology challenges for the 45-nm technology node and beyond

Allgair, John A., Archie, Chas N., Bunday, Benjamin D., Bishop, Mike, Lipscomb, Pete, Orji, Ndubuisi G.

Year:

2006

Language:

english

File:

PDF, 1.71 MB

english, 2006

20

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Major trends in extending CD-SEM utility

Bunday, Benjamin, Archie, Chas N., Allgair, John, Yang, Kyoungmo, Koshihara, Shunsuke, Morokuma, Hidetoshi, Danilevsky, Alex, Parker, Cindy, Page, Lorena

Year:

2007

Language:

english

File:

PDF, 2.56 MB

english, 2007

21

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - Automated CD-SEM recipe creation: a new paradigm in CD-SEM utilization

Bunday, Benjamin, Archie, Chas N., Lipscomb, William, Allgair, John, Yang, Kyoungmo, Koshihara, Shunsuke, Morokuma, Hidetoshi, Page, Lorena, Danilevsky, Alex

Year:

2006

Language:

english

File:

PDF, 1.13 MB

english, 2006

22

Cancer of the Bladder. A Study Based on 902 Epithelial Tumors of the Bladder in the Carcinoma Registry of the American urological Association. The Committee on Carcinoma Registry

Kretschmer, Herman L., Barringer, Benjamin S., Braasch, William F., Dean, Archie L., Ferguson, Russell S., Keyes, Edward L., Smith, George Gilbert

Journal:

The Journal of Urology

Year:

1934

Language:

english

File:

PDF, 6.26 MB

english, 1934

23

Epithelioma of the Penis 1 , 2

Barringer, Benjamin S., Dean, Archie L.

Journal:

The Journal of Urology

Year:

1924

Language:

english

File:

PDF, 1.52 MB

english, 1924

24

Tenth Anniversary Report of the Carcinoma Registry Committee of the American Urological Association, 1927–1937

Ferguson, Russell S., Kretschmer, Herman L., Barringer, Benjamin S., Braasch, William F., Dean, Archie L., Scholl, Albert J., Ash, Lt. Col. J.E.

Journal:

The Journal of Urology

Year:

1938

Language:

english

File:

PDF, 1.45 MB

english, 1938

25

Validation of OSHUN against collisionless and collisional plasma physics

Joglekar, Archis S, Winjum, Benjamin J, Tableman, Adam, Wen, Han, Tzoufras, Michail, Mori, Warren B

Journal:

Plasma Physics and Controlled Fusion

Year:

2018

Language:

english

File:

PDF, 647 KB

english, 2018

26

Alternative Bone Graft Sources and Techniques for Tibiofibular Synostosis Creation Following Transtibial Amputation

Overmann, Archie, Potter, Benjamin K.

Journal:

JBJS Case Connector

Year:

2015

Language:

english

File:

PDF, 1.14 MB

english, 2015

27

Complications of Combat Blast Injuries and Wounds

Richards, John T., Overmann, Archie, Forsberg, Jonathan A., Potter, Benjamin K.

Journal:

Current Trauma Reports

Year:

2018

Language:

english

File:

PDF, 2.93 MB

english, 2018

28

Incidence and Characteristics of Humeral Shaft Fractures After Subpectoral Biceps Tenodesis

Overmann, Archie L., Colantonio, Donald F., Wheatley, Benjamin M., Volk, William R., Kilcoyne, Kelly G., Dickens, Jonathan F.

Journal:

Orthopaedic Journal of Sports Medicine

Year:

2019

Language:

english

File:

PDF, 267 KB

english, 2019

29

The management of embedded metal fragment patients and the role of chelation Therapy: A workshop of the Department of Veterans AffairsâWalter Reed National Medical Center

Gaitens, Joanna M., Potter, Benjamin K., D'Alleyrand, JeanâClaude G., Overmann, Archie L., Gochfeld, Michael, Smith, Donald R., Breyer, Richard, McDiarmid, Melissa A.

Journal:

American Journal of Industrial Medicine

Year:

2020

File:

PDF, 1.03 MB

2020

30

Rescue therapy with thrombolysis in patients with severe COVID-19-associated acute respiratory distress syndrome

Price, Laura C., Garfield, Benjamin, Bleakley, Caroline, Keeling, Archie G.M., Mcfadyen, Charles, McCabe, Colm, Ridge, Carole A., Wort, Stephen J., Price, Susanna, Arachchillage, Deepa J.

Journal:

Pulmonary Circulation

Year:

2020

File:

PDF, 539 KB

2020